Patents

[EN] Xike Zhang, Liwei Xiong, Xi Li. A Method for using monitor with crack bending deformation measurement function (Grant No.: 201711315740.4)

[EN] Xike Zhang, Liwei Xiong, Xi Li. Appliecation of the crack deformation monitor (Grant No.: 201711316486.X)

[EN] Xike Zhang, Liwei Xiong, Xi Li. A monitor with crack bending deformation measurement function (Grant No.: 201721718610.0)

[EN] Xike Zhang, Liwei Xiong, Xi Li. Crack deformation monitor. (Grant No.: 201721719629.7)